Fast thermal conductivity tester

I. Definition

Transient planar heat source technique (TPS) is a new method for measuring thermal conductivity, developed by Professor Silas Gustafsson at Chalmer University of Technology in Sweden on the basis of the hot wire method. The principle of measuring the thermal properties of materials is based on the transient temperature response generated by a step heated disc-shaped heat source in an infinite medium. A flat probe made of a thermally resistant material acts as both a heat source and a temperature sensor. The thermal resistance coefficient of the alloy - the relationship between temperature and resistance is linear, that is, the heat loss can be known by understanding the change in resistance, which reflects the thermal conductivity of the sample. The probe of this method is a continuous double helix structure sheet formed by etching of conductive alloy, and the outer layer is a double layer of insulation protection, the thickness is very thin, which makes the probe have a certain mechanical strength and maintain the electrical insulation between the sample. During the test, the probe is placed in the middle of the sample for testing. When the current passes through the probe, a certain temperature rise is generated, and the generated heat is diffused to the sample on both sides of the probe, and the speed of thermal diffusion depends on the heat conduction characteristics of the material. By recording the temperature and the response time of the probe, the thermal conductivity can be obtained directly from the mathematical model.

Product features:

1. Wide test range, stable test performance;

2, direct measurement, test time about 5-160s can be set, can quickly and accurately measure the thermal conductivity, saving a lot of time;

3, will not be affected by the same contact thermal resistance as the static method;

4, no special sample preparation, there is no special requirement for the shape of the sample, the bulk solid only needs to be relatively smooth sample surface and meet the length and width
At least twice the diameter of the probe;

5, non-destructive testing of the sample, meaning that the sample can be reused;

6, the probe adopts the structure of double helix to design, combined with the exclusive mathematical model, the core algorithm is used to analyze the data collected on the probe

7, the structure of the sample table is clever, easy to operate, suitable for placing samples of different thickness, and simple and beautiful;

8, the probe data acquisition using imported data acquisition chip, the chip's high resolution, can make the test results more accurate and reliable;

9, the control system of the host uses ARM microprocessor, the computing speed is faster than the traditional microprocessor, improve the analysis and processing ability of the system, the calculation results are more accurate;

10, the instrument can be used for the determination of bulk solid, paste solid, granular solid, colloidal, liquid, powder, coating, film, insulation material and other thermal physical parameters;

11, intelligent human-machine interface, color LCD display, touch screen control, easy and simple operation;